Join EdX and take all 9 parts of the PHI XPS VersaProbe III online training module, including all 9 quizzes.Complete the process to become a lab member of SNSF and follow the instructions to activate a Badger account.In order to become a qualified user on the PHI VeraProbe 3, you need to follow each of these steps in the order as listed here: Samples requiring air-free transfer will be directed to the VersaProbe 1 XPS instrument. It is useful to know in advance if the sample is conducting. Samples are generally mounted using clips onto standard fixtures. Powdered and other rough surfaced samples can also be analyzed. A sample can range in size from 0.1 mm in diameter and very thin to 5cm in diameter and 5mm thick. Restrictions on samples: Samples must be solid and vacuum compatible. Spectrometer: Monochromatized Al(Ka) Source Vacuum ~ 1.2x10E(-7) Pa.Spot sizes: 10um - 200um or 1400um x 100um with High Power setting.For improved sample throughput and data collection efficiency.Records top-down image of sample before entry for sample registration and easy navigation.

Improved Angle Resolved XPS (ARXPS) with collection angle-limiting aperture.Ideal for polymer samples and other samples easily damaged by traditional ion beam etching.Provides surface cleaning and depth profiling with minimal sample damage and disruption to stoichiometry.Bombards sample with clusters of Ar ions at various beam energies.Ar 2500+ Gas Cluster Ion Beam Gun (GCIB).Provides surface cleaning and depth profile capabilities at various beam energies and raster sizes.Bombards sample with a focused beam of energized Ar ions.For controlled cooling experiments (-140C) using liquid nitrogen.For controlled heating experiments from room temperature to 600C.It uses Al(Ka) radiation (1486 eV) and is equipped with the following advanced features: The PHI VersaProbe 3 XPS offers improved sensitivity over the VersaProbe 1 through greater signal collection for elemental surface composition measurements and high-resolution binding energy chemical shift measurements of solid samples under high vacuum. Depth Profiles: Characterizes buried regions as they are exposed by ion etching.Chemical Analysis: Identifies bonds between specific atoms in the surface region.Compositional Analysis: Atomic abundance of all elements (except H and He) on insulators, powders, metals, etc.Because only atoms near the surface of the sample emit electrons that escape without losing energy, the technique is very surface sensitive. From the energies detected, the elements present and sometimes their chemical state (valence) can be determined. Getting Started and Training Informationīasic theory of operation: In XPS, soft x-rays (1486 eV for our instrument) illuminate a region of the sample being analyzed, and photolelectrons emanating from it are energy analyzed.

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